DocumentCode
81478
Title
Design of GeSn-Based Heterojunction-Enhanced N-Channel Tunneling FET With Improved Subthreshold Swing and ON-State Current
Author
Mingshan Liu ; Yan Liu ; Hongjuan Wang ; Qingfang Zhang ; Chunfu Zhang ; Shengdong Hu ; Yue Hao ; Genquan Han
Author_Institution
Key Lab. of Optoelectron. Technol. & Syst., Chongqing Univ., Chongqing, China
Volume
62
Issue
4
fYear
2015
fDate
Apr-15
Firstpage
1262
Lastpage
1268
Abstract
We design a heterojunction-enhanced n-channel tunneling FET (HE-NTFET) employing a Ge1−x Snx /Ge1−y Sny (
) heterojunction located in the channel region with a distance of
from the source-channel tunneling junction. We investigate the impact of
on the performance of HE-NTFETs by simulation. HE-NTFETs achieve a positive shift of
, a steeper subthreshold swing (SS), and an enhanced
compared with homo-NTFETs, which is attributed to the modulating effect of heterojunction on band-to-band tunneling (BTBT). At a supply voltage of 0.3 V, 304%
enhancement is demonstrated in the Ge0.92Sn0.08/Ge0.94Sn0.06 HE-NTFET with a 4 nm
over Ge0.92Sn0.08 homo-NTFET due to the steeper average SS. The impact of Sn composition on the performance of HE-NTFETs is also studied. As we increase the difference in Sn composition
across the heterojunction,
and SS of HE-NTFETs are improved due to the increase in band offsets at the Ge1−x Snx /Ge1−y Sny interface, which leads to the enhanced modulating effect of heterojunction on BTBT.
Keywords
field effect transistors; germanium compounds; semiconductor heterojunctions; tunnel transistors; Ge0.92Sn0.08; Ge0.94Sn0.06; HE-NTFET; band-to-band tunneling; heterojunction-enhanced N-channel tunneling FET; improved subthreshold swing; on-state current; size 4 nm; source-channel tunneling junction; voltage 0.3 V; Educational institutions; Heterojunctions; Performance evaluation; Photonic band gap; Semiconductor process modeling; Tin; Tunneling; Band-to-band tunneling (BTBT); Germanium-Tin (GeSn); heterostructure; steep subthreshold swing (SS); tunneling FET (TFET); tunneling FET (TFET).;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2015.2403571
Filename
7050321
Link To Document