DocumentCode
814795
Title
Pattern classification and scene analysis
Author
Chien, Yu-Shiang
Author_Institution
University of Connecticut, Storrs, CT, USA
Volume
19
Issue
4
fYear
1974
fDate
8/1/1974 12:00:00 AM
Firstpage
462
Lastpage
463
Keywords
Book reviews; Application software; Books; Computer graphics; Computer science; Image analysis; Learning systems; Mathematics; Pattern analysis; Pattern classification; Pattern recognition;
fLanguage
English
Journal_Title
Automatic Control, IEEE Transactions on
Publisher
ieee
ISSN
0018-9286
Type
jour
DOI
10.1109/TAC.1974.1100577
Filename
1100577
Link To Document