DocumentCode :
814795
Title :
Pattern classification and scene analysis
Author :
Chien, Yu-Shiang
Author_Institution :
University of Connecticut, Storrs, CT, USA
Volume :
19
Issue :
4
fYear :
1974
fDate :
8/1/1974 12:00:00 AM
Firstpage :
462
Lastpage :
463
Keywords :
Book reviews; Application software; Books; Computer graphics; Computer science; Image analysis; Learning systems; Mathematics; Pattern analysis; Pattern classification; Pattern recognition;
fLanguage :
English
Journal_Title :
Automatic Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9286
Type :
jour
DOI :
10.1109/TAC.1974.1100577
Filename :
1100577
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=814795
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