Title :
Pattern recognition and machine learning
Author_Institution :
Rensselaer Polytechnic Institute, Troy, NY, USA
fDate :
8/1/1974 12:00:00 AM
Keywords :
Book reviews; Learning systems; Pattern recognition; Books; Control systems; Inference algorithms; Learning systems; Machine learning; Noise reduction; Pattern recognition; Process control; Stochastic systems; System identification;
Journal_Title :
Automatic Control, IEEE Transactions on
DOI :
10.1109/TAC.1974.1100578
