• DocumentCode
    815090
  • Title

    Selective Deposition of Hafnium Oxide Nanothin Films on OTS Patterned Si(100) Substrates by Metal–Organic Chemical Vapor Deposition

  • Author

    Kang, Byung-Chang ; Jung, Duk-Young ; Boo, Jin-Hyo

  • Author_Institution
    Dept. of Chem., Sungkyunkwan Univ., Suwon
  • Volume
    5
  • Issue
    6
  • fYear
    2006
  • Firstpage
    701
  • Lastpage
    706
  • Abstract
    Soft lithography is a method for the manufacture of micro/nano size patterns and structures by using organic materials without the use of high energy. In particular, microcontact printing (muCP) is a very convenient and nonphotolithographic technique that can generate patterned features of self-assembled monolayers (SAMs). In this study, we carried out the selective deposition of HfO2 nano-thin films on Si(100) substrates by combination of muCP using octadecyltrichlorosilane (OTS) and metal-organic chemical vapor deposition (MOCVD). Single molecular precursor of Hf(OtBu) 4 was used for the growth of HfO2 nano-films, and the deposition was carried out between 150degC and 400degC at a pressure of 3times10-2 torr. The as-grown films were characterized by x-ray diffraction (XRD), optical microscopy (OM), scanning electron microscopy (SEM), energy dispersive x-ray (EDX), x-ray photoelectron spectroscopy (XPS), and capacitance-voltage (C-V) and current-voltage (I-V) measurement. It is expected that the combination of muCP of SAM and MOCVD is a better method for fabricating the HfO 2 thin films between micro and nano sizes
  • Keywords
    MOCVD; X-ray chemical analysis; X-ray diffraction; X-ray photoelectron spectra; electrical conductivity; hafnium compounds; high-k dielectric thin films; monolayers; nanopatterning; nanostructured materials; optical microscopy; scanning electron microscopy; self-assembly; soft lithography; 150 to 400 C; 3times10-2 torr; C-V measurement; EDX; HfO2; I-V measurement; MOCVD; OM; OTS; SAMs; SEM; Si; X-ray diffraction; X-ray photoelectron spectroscopy; XPS; XRD; capacitance-voltage measurement; current-voltage measurement; energy dispersive X-ray analysis; hafnium oxide nanothin films; metal-organic chemical vapor deposition; microcontact printing; muCP; nonphotolithographic technique; octadecyltrichlorosilane; optical microscopy; organic materials; patterned Si(100) substrates; scanning electron microscopy; self-assembled monolayers; soft lithography; Capacitance-voltage characteristics; Chemical vapor deposition; Hafnium oxide; MOCVD; Manufacturing; Optical films; Optical microscopy; Photoelectron microscopy; Scanning electron microscopy; Soft lithography; HFO$_2$ thin film; metal–organic chemical vapor deposition (MOCVD); microcontact printing; selective growth;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2006.881274
  • Filename
    4011928