Modified optical frequency domain reflectometry with high spatial resolution for components of integrated optic systems

An apparatus which allows detection of scatterers and faults as well as measurement of reflections in fiber or integrated optic devices and systems with a spatial resolution in the region of 10-100 mu m is discussed. The dynamic range is sufficient to detect reflection with a reflection coefficient down to 10/sup -10/. The system uses a modified optical frequency domain reflectometry (OFDR) technique whereby signal light and local oscillator light are coupled into the waveguide under test from opposite directions. The measurement principle requires the wavelength of the light source to be swept continuously up or down. It is shown that the experimental relationship between frequency shift and waveguide length is in fairly good agreement with the theoretical estimate. Polarization-sensitive experimental results are given for reflection factors in short, side-polished polarization-maintaining fibers.<>