• DocumentCode
    815327
  • Title

    Design of an Impulse Commutation Bridge for the Solid-State Transfer Switch

  • Author

    Cheng, Po-Tai ; Chen, Yu-Hsing

  • Author_Institution
    Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu
  • Volume
    44
  • Issue
    4
  • fYear
    2008
  • Firstpage
    1249
  • Lastpage
    1258
  • Abstract
    Voltage sags have become a very critical power quality issue in recent years. In particular, in the high-tech industry parks of Taiwan, manufacturers can lose up to one million U.S. dollars for each voltage sag event. Some utility companies provide dual power feeders to these high-tech manufacturers to enhance power quality and reliability. The solid-state transfer switch (STS) based on thyristors can thus utilize the dual power feeders to protect sensitive loads against voltage sags. Conventional STS often requires more than a quarter cycle to complete the transfer process because its commutation is load dependent. An improved STS with impulse commutated circuit can greatly reduce the transfer time and provide better ride-through capability against voltage sags. In this paper, an impulse commutation bridge STS (ICBSTS) system is proposed to further simplify the forced-commutation circuitry. This paper also discusses the in-rush phenomenon of the transformer due to the line transfer. A flux estimator is developed with the ICBSTS system to reduce the in-rush current.
  • Keywords
    power electronics; power supply quality; dual power feeders; flux estimator; forced-commutation circuitry; impulse commutation bridge STS system; line transfer; power quality; solid-state transfer switch; voltage sags; Bridge circuits; Manufacturing industries; Power quality; Power system stability; Protection; Sociotechnical systems; Solid state circuits; Switches; Thyristors; Voltage fluctuations; Flux estimator; impulse commutation bridge STS (ICBSTS); in-rush current; power quality; solid-state transfer switch (STS); voltage sag;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.2008.926311
  • Filename
    4578777