DocumentCode
815479
Title
Testing methodologies for analog-to-digital converters
Author
Brandolini, Arnaldo ; Gandelli, Alessandro
Author_Institution
Dipartimento di Elettrotecnica, Politecnico di Milano, Italy
Volume
41
Issue
5
fYear
1992
fDate
10/1/1992 12:00:00 AM
Firstpage
595
Lastpage
603
Abstract
A theoretical approach and an experimental test system devoted to introducing a set of parameters based on Walsh functions and conformed to characterize the transfer function of analog-to-digital converters are presented. Building on the previous work, the authors propose an enhanced system that provides better accuracy in the evaluation of the performance of conversion devices under dynamic conditions. The theory covers an introductive approach to generalize the conversion processes and employs a powerful purpose-oriented tool to understand their in-depth operativity. The error parameters are defined by mathematical algorithms based on Walsh functions and related transform, while their properties are correlated to a standard reference input, a triangular waveform provided by the system. This methodology opens the wave towards the introduction of standard techniques in testing conversion devices
Keywords
Walsh functions; analogue-digital conversion; automatic test equipment; electronic equipment testing; error analysis; transfer functions; A/D convertor; Walsh functions; analog-to-digital converters; dynamic conditions; error parameters; mathematical algorithms; transfer function; triangular waveform; Analog-digital conversion; Fourier transforms; Frequency; Helium; Impulse testing; Manufacturing; Sampling methods; System testing; Transfer functions; Voltage;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.177328
Filename
177328
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