• DocumentCode
    815479
  • Title

    Testing methodologies for analog-to-digital converters

  • Author

    Brandolini, Arnaldo ; Gandelli, Alessandro

  • Author_Institution
    Dipartimento di Elettrotecnica, Politecnico di Milano, Italy
  • Volume
    41
  • Issue
    5
  • fYear
    1992
  • fDate
    10/1/1992 12:00:00 AM
  • Firstpage
    595
  • Lastpage
    603
  • Abstract
    A theoretical approach and an experimental test system devoted to introducing a set of parameters based on Walsh functions and conformed to characterize the transfer function of analog-to-digital converters are presented. Building on the previous work, the authors propose an enhanced system that provides better accuracy in the evaluation of the performance of conversion devices under dynamic conditions. The theory covers an introductive approach to generalize the conversion processes and employs a powerful purpose-oriented tool to understand their in-depth operativity. The error parameters are defined by mathematical algorithms based on Walsh functions and related transform, while their properties are correlated to a standard reference input, a triangular waveform provided by the system. This methodology opens the wave towards the introduction of standard techniques in testing conversion devices
  • Keywords
    Walsh functions; analogue-digital conversion; automatic test equipment; electronic equipment testing; error analysis; transfer functions; A/D convertor; Walsh functions; analog-to-digital converters; dynamic conditions; error parameters; mathematical algorithms; transfer function; triangular waveform; Analog-digital conversion; Fourier transforms; Frequency; Helium; Impulse testing; Manufacturing; Sampling methods; System testing; Transfer functions; Voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.177328
  • Filename
    177328