DocumentCode :
815570
Title :
A nonlinear least-squares solution with causality constraints applied to transmission line permittivity and permeability determination
Author :
Jarvis, James Baker ; Geyer, Richard G. ; Domich, Paul D.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Volume :
41
Issue :
5
fYear :
1992
fDate :
10/1/1992 12:00:00 AM
Firstpage :
646
Lastpage :
652
Abstract :
A technique for the solution of one-port and two-port scattering equations for complex permittivity and permeability determination is presented. Using a nonlinear regression procedure, the model determines parameters for the specification of the spectral functional form of complex permittivity and permeability. The method is based on a nonlinear regression technique and uses the fact that a causal, analytic function can be represented by poles and zeros. The technique allows the accurate determination of many low- and high-permittivity dielectric and magnetic materials in either the low- or high-loss range. The model allows for small adjustments, consistent with the physics of the problem, to independent variable data such as angular frequency, sample length, sample position, and cut-off wavelength. The model can determine permittivity and permeability for samples where sample length, sample position, and sample holder length are not known precisely. The problem of local minima is discussed
Keywords :
S-parameters; least squares approximations; magnetic permeability measurement; microwave measurement; permittivity measurement; poles and zeros; transmission line theory; causality constraints; dielectric materials; local minima; magnetic materials; nonlinear least-squares solution; nonlinear regression; one-port scattering equations; permeability; poles and zeros; transmission line permittivity; two-port scattering equations; Cutoff frequency; Dielectrics; Magnetic analysis; Magnetic materials; Nonlinear equations; Permeability; Permittivity; Physics; Poles and zeros; Scattering;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.177336
Filename :
177336
Link To Document :
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