DocumentCode :
815625
Title :
Power and Reliability Management of SoCs
Author :
Rosing, Tajana Simunic ; Mihic, Kresimir ; De Micheli, Giovanni
Author_Institution :
Dept. of Comput. Sci. Eng., California Univ., San Diego, La Jolla, CA
Volume :
15
Issue :
4
fYear :
2007
fDate :
4/1/2007 12:00:00 AM
Firstpage :
391
Lastpage :
403
Abstract :
Today´s embedded systems integrate multiple IP cores for processing, communication, and sensing on a single die as systems-on-chip (SoCs). Aggressive transistor scaling, decreased voltage margins and increased processor power and temperature have made reliability assessment a much more significant issue. Although reliability of devices and interconnect has been broadly studied, in this work, we study a tradeoff between reliability and power consumption for component-based SoC designs. We specifically focus on hard error rates as they cause a device to permanently stop operating. We also present a joint reliability and power management optimization problem whose solution is an optimal management policy. When careful joint policy optimization is performed, we obtain a significant improvement in energy consumption (40%) in tandem with meeting a reliability constraint for all SoC operating temperatures
Keywords :
embedded systems; industrial property; integrated circuit reliability; integrated circuit testing; system-on-chip; embedded systems; intellectual property; power management; reliability management; system-on-chip; transistor scaling; Constraint optimization; Embedded system; Energy consumption; Energy management; Error analysis; Power system interconnection; Power system management; Power system reliability; Temperature sensors; Voltage; Optimal control; power consumption; reliability management;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2007.895245
Filename :
4162514
Link To Document :
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