Title :
Dielectric material measurement of thin samples at millimeter wavelengths
Author :
Dudeck, Kenneth E. ; Buckley, Leonard J.
Author_Institution :
Pennsylvania State Univ., Hazelton, PA, USA
fDate :
10/1/1992 12:00:00 AM
Abstract :
Complex permittivity and permeability measurements at millimeter wave frequencies of thin samples (0.12 to 1.0 mm) were obtained. The methodology and considerations for making automated waveguide material measurements of thin samples in the 26.5-GHz to 40-GHz (R-band) frequency range are described. Measurement results for various dielectric materials are included
Keywords :
microwave measurement; permittivity measurement; waveguides; 0.12 to 1.0 mm; 26.5 to 40 GHz; R-band; automated waveguide material measurements; complex permittivity measurement; dielectric materials; microwave measurement; millimeter wave frequencies; permeability measurements; polyaniline; polymer films; thin samples; Delay; Dielectric materials; Dielectric measurements; Frequency; Millimeter wave measurements; Millimeter wave technology; Permeability; Permittivity measurement; Polymers; Wavelength measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
