DocumentCode
815767
Title
Dielectric material measurement of thin samples at millimeter wavelengths
Author
Dudeck, Kenneth E. ; Buckley, Leonard J.
Author_Institution
Pennsylvania State Univ., Hazelton, PA, USA
Volume
41
Issue
5
fYear
1992
fDate
10/1/1992 12:00:00 AM
Firstpage
723
Lastpage
725
Abstract
Complex permittivity and permeability measurements at millimeter wave frequencies of thin samples (0.12 to 1.0 mm) were obtained. The methodology and considerations for making automated waveguide material measurements of thin samples in the 26.5-GHz to 40-GHz (R -band) frequency range are described. Measurement results for various dielectric materials are included
Keywords
microwave measurement; permittivity measurement; waveguides; 0.12 to 1.0 mm; 26.5 to 40 GHz; R-band; automated waveguide material measurements; complex permittivity measurement; dielectric materials; microwave measurement; millimeter wave frequencies; permeability measurements; polyaniline; polymer films; thin samples; Delay; Dielectric materials; Dielectric measurements; Frequency; Millimeter wave measurements; Millimeter wave technology; Permeability; Permittivity measurement; Polymers; Wavelength measurement;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.177352
Filename
177352
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