DocumentCode :
815821
Title :
28th IEEE Annual International Nuclear and Space Radiation Effects Conference (NSREC ´91)
Volume :
38
Issue :
6
fYear :
1991
fDate :
12/1/1991 12:00:00 AM
Abstract :
The following topics are dealt with: basic mechanisms of radiation effects; dosimetry and energy-dependent effects; isolation technologies; device radiation response and hardening; microcircuit radiation response and hardening; single-event phenomena; hardness assurance and testing techniques; spacecraft charging and space environments and effects
Keywords :
dosimetry; integrated circuit technology; radiation effects; radiation hardening (electronics); semiconductor technology; space vehicles; device radiation response; dosimetry; energy-dependent effects; hardness assurance; hardness testing; isolation technologies; microcircuit radiation response; radiation effects; radiation hardness; single-event phenomena; space environments; spacecraft charging;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.124059
Filename :
124059
Link To Document :
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