DocumentCode
815926
Title
The multiple window parameter transform
Author
Califano, Andrea ; Bolle, Ruud M.
Author_Institution
IBM T.J. Watson Res. Center, Yorktown Heights, NY, USA
Volume
14
Issue
12
fYear
1992
fDate
12/1/1992 12:00:00 AM
Firstpage
1157
Lastpage
1170
Abstract
The multiwindow transform, an extension of parameter transform techniques that increase performance and scope by exploiting the long-range correlated information contained in multiple portions of an image, is presented. Multiple-window transforms allow the extraction of high-dimensional features with improvement in accuracy over conventional techniques while keeping linear to low-order-polynomial computational and space requirements with respect to image size and dimensionality of the features. Using correlated information provides a direct link between extracted features and supporting regions in the image. This, coupled with evidence integration techniques, is used to suppress noisy or nonexistent feature hypotheses. Parameter spaces are implemented as constraint satisfaction networks, where feature hypotheses with overlapping support in the image compete. After an iterative relaxation phase, surviving hypotheses have disjoint support, forming a segmentation of the image. Examples show the performance and provide insight about the behavior
Keywords
computational complexity; feature extraction; image processing; image segmentation; transforms; computational requirements; constraint satisfaction networks; correlated information; disjoint support; evidence integration techniques; feature dimensionality; feature extraction; high-dimensional features; image segmentation; image size; iterative relaxation phase; multiple window parameter transform; noisy feature hypothesis suppression; nonexistent feature hypotheses; parameter spaces; space requirements; Computational complexity; Data mining; Feature extraction; Image edge detection; Image reconstruction; Image segmentation; Parameter estimation; Polynomials; Shape; Surface reconstruction;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/34.177381
Filename
177381
Link To Document