• DocumentCode
    816103
  • Title

    Interval methods for modeling uncertainty in RC timing analysis

  • Author

    Harkness, Cheryl L. ; Lopresti, Daniel P.

  • Author_Institution
    Dept. of Comput. Sci., Brown Univ., Providence, RI, USA
  • Volume
    11
  • Issue
    11
  • fYear
    1992
  • fDate
    11/1/1992 12:00:00 AM
  • Firstpage
    1388
  • Lastpage
    1401
  • Abstract
    The authors propose representing uncertain parameters as intervals and present a theoretical framework based on interval algebra for manipulating these ranges. To illustrate this methodology, they modify an existing RC analysis algorithm (Crystal´s PR-Slope model) to create one which computes worst-case delay bounds when given uncertain input parameters. They provide proofs of correctness for the approach and test its performance. Two alternate interval-based techniques which produce even tighter bounds than the original approach are also presented. When compared to Monte Carlo simulation, the interval methods are more precise and significantly faster
  • Keywords
    MOS integrated circuits; VLSI; circuit analysis computing; delays; NMOS; PR-Slope model; RC analysis algorithm; RC timing analysis; VLSI design; interval algebra; interval methods; interval-based techniques; sequential MOS VLSI; timing verification; uncertain input parameters; worst-case delay bounds; CMOS technology; Capacitance; Circuits; Delay; Fabrication; MOS devices; Manufacturing processes; Timing; Uncertainty; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.177402
  • Filename
    177402