• DocumentCode
    816138
  • Title

    A 2.5-10-Gb/s CMOS transceiver with alternating edge-sampling phase detection for loop characteristic stabilization

  • Author

    Lee, Bong-Joon ; Hwang, Moon-Sang ; Lee, Sang-Hyun ; Jeong, Deog-Kyoon

  • Author_Institution
    Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
  • Volume
    38
  • Issue
    11
  • fYear
    2003
  • Firstpage
    1821
  • Lastpage
    1829
  • Abstract
    This paper describes a technique for stabilizing the binary phase detector (PD) gain under various jitter conditions. A dead zone in the phase detector estimates the magnitude of high-frequency data jitter, and the resulting jitter information is used to control the charge-pump current. An alternating edge-sampling (AES) PD reduces hardware overhead by removing possible redundancies in previous dead-zone implementations. A series sense amplifier driven by a single-phase clock helps high-speed data sampling with increased data evaluation time. A dual path voltage-controlled oscillator incorporating dual-loop architecture enables wide-range operation of clock/data recovery circuits with low jitter. Fabricated in a 0.18-μm CMOS process, a test transceiver operates from 2.5 to 11.5 Gb/s with a bit-error rate of less than 10-12 while consuming 540 mW from a 1.8-V supply.
  • Keywords
    CMOS digital integrated circuits; high-speed integrated circuits; phase detectors; timing jitter; transceivers; voltage-controlled oscillators; 0.18 micron; 1.8 V; 2.5 to 10 Gbit/s; 540 mW; CMOS transceiver; alternating edge-sampling phase detection; binary phase detector; bit-error rate; charge-pump current; data evaluation time; dual path voltage-controlled oscillator; hardware overhead; high-frequency data jitter; high-speed data sampling; jitter conditions; jitter information; loop characteristic stabilization; series sense amplifier; Charge pumps; Clocks; Detectors; Hardware; Jitter; Phase detection; Phase estimation; Sampling methods; Transceivers; Voltage-controlled oscillators;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2003.818290
  • Filename
    1240961