DocumentCode :
816213
Title :
Fullband quantization analysis reveals a third valley in [001] silicon inversion layers
Author :
Esseni, David ; Palestri, Pierpaolo
Author_Institution :
DIEGM, Udine, Italy
Volume :
26
Issue :
6
fYear :
2005
fDate :
6/1/2005 12:00:00 AM
Firstpage :
413
Lastpage :
415
Abstract :
This letter presents calculations of the silicon two-dimensional (2-D) band structure obtained by accounting for the fullband energy dispersion of the three-dimensional silicon crystal, as derived from the non-local-pseudopotential method. The most interesting result is the identification of a third valley for the 2-D electron gas in the [001] quantization direction, besides the two families of subbands (the unprimed and primed ones) universally considered according to the effective mass approximation.
Keywords :
MOSFET; elemental semiconductors; inversion layers; semiconductor device models; silicon; two-dimensional electron gas; 001 quantization direction; 2D density of states; 2D electron gas; 3D silicon crystal; MOSFET; Si; effective mass approximation; full band energy dispersion; fullband quantization analysis; nonlocal-pseudopotential method; quantization models; silicon 2D band structure; silicon inversion layers; Effective mass; Eigenvalues and eigenfunctions; Electrons; Lattices; MOSFETs; Quantization; Scattering; Schrodinger equation; Silicon; Two dimensional displays; Effective mass approximation; MOSFETs; Silicon inversion layers; quantization models; two–dimensional (2-D) density of states (DOS);
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2005.848126
Filename :
1432916
Link To Document :
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