• DocumentCode
    816217
  • Title

    A 1.3-GHz fifth-generation SPARC64 microprocessor

  • Author

    Ando, Hisashige ; Yoshida, Yuuji ; Inoue, Aiichiro ; Sugiyama, Itsumi ; Asakawa, Takeo ; Morita, Kuniki ; Muta, Toshiyuki ; Motokurumada, Tsuyoshi ; Okada, Seishi ; Yamashita, Hideo ; Satsukawa, Yoshihiko ; Konmoto, Akihiko ; Yamashita, Ryouichi ; Sugiyam

  • Author_Institution
    Fujitsu Ltd., Kawasaki, Japan
  • Volume
    38
  • Issue
    11
  • fYear
    2003
  • Firstpage
    1896
  • Lastpage
    1905
  • Abstract
    A fifth-generation SPARC64 processor is fabricated in 130-nm partially depleted silicon-on-insulator CMOS with eight layers of Cu metallization. At Vdd = 1.2 V and Ta = 25°C, it runs at 1.3 GHz and dissipates 34.7 W. The chip contains 191 M transistors with 19 M logic circuits in an area of 18.14 mm × 15.99 mm and is covered with 5858 bumps, of which 269 are for I/O signals. It is mounted in a 1360-pin land-grid-array package. The 16-byte-wide system bus operates with a 260-MHz clock in single-data-rate or double-data-rate modes. This processor implements an error-detection mechanism for execution units and data path logic circuits in addition to on-chip arrays to detect data corruption. Intermittent errors detected in execution units and data paths are recovered via instruction retry. A soft barrier clocking scheme allows amortization of the clock skew and jitter over multiple cycles and helps to achieve high clock frequency. Tunability of the clock timing makes timing closure easier. A relatively small amount of custom circuit design and the use of mostly static circuits contributes to achieve short development time.
  • Keywords
    CMOS digital integrated circuits; VLSI; error detection; fault tolerant computing; fifth generation systems; high-speed integrated circuits; integrated circuit reliability; microprocessor chips; silicon-on-insulator; system recovery; timing; 1.2 V; 1.3 GHz; 130 nm; 260 MHz; 34.7 W; Cu; Cu metallization; Si; data path logic circuits; detect data corruption; double-data-rate modes; error-detection mechanism; execution units; fifth-generation SPARC64 microprocessor; instruction retry; land-grid-array package; on-chip arrays; partially depleted SOI CMOS; single-data-rate modes; soft barrier clocking scheme; CMOS process; Clocks; Logic arrays; Logic circuits; Metallization; Microprocessors; Packaging; Silicon on insulator technology; System buses; Timing;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2003.818146
  • Filename
    1240969