Title :
512-Mb PROM with a three-dimensional array of diode/antifuse memory cells
Author :
Johnson, Mark ; Al-Shamma, A. ; Bosch, D. ; Crowley, M. ; Farmwald, M. ; Fasoli, L. ; Ilkbahar, A. ; Kleveland, B. ; Lee, Taewoo ; Tz-yi Liu ; Quang Nguyen ; Scheuerlein, R. ; So, K. ; Thorp, T.
Author_Institution :
Matrix Semicond., Santa Clara, CA, USA
Abstract :
A 512-Mb one-time-programmable memory is described, which uses a transistorless two-terminal memory cell containing an antifuse and a diode. Cells are fabricated in polycrystalline silicon, stacked vertically in eight layers above a 0.25-/spl mu/m CMOS substrate. One-time programming is performed by applying a high voltage across the cell terminals, which ruptures the antifuse and permanently encodes a logic 0. Unruptured antifuses encode a logic 1. Cells are arranged in 8-Mb tiles, 1 K rows by 1 K columns by 8 bits high. The die contains 72 such tiles: 64 tiles for data and eight tiles for error-correcting code bits. Wordline and bitline decoders, bias circuits, and sense amplifiers are built in the CMOS substrate directly beneath the memory tiles, improving die efficiency. The device supports a generic standard NAND flash interface and operates from a single 3.3-V supply.
Keywords :
CMOS memory circuits; PROM; VLSI; elemental semiconductors; memory architecture; silicon; 0.25 micron; 3.3 V; 3D diode/antifuse memory cell array; 512 Mbit; CMOS substrate; PROM; Si; bias circuits; bitline decoders; error-correcting code; generic standard NAND flash interface; one-time-programmable memory; polycrystalline Si; sense amplifiers; three-dimensional array; transistorless two-terminal memory cell; vertically stacked layers; wordline decoders; CMOS logic circuits; CMOS memory circuits; Decoding; Diodes; Error correction codes; Logic programming; PROM; Silicon; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2003.818147