Title :
Investigation of the Transport Properties of Silicon Nanowires Using Deterministic and Monte Carlo Approaches to the Solution of the Boltzmann Transport Equation
Author :
Lenzi, Marco ; Palestri, Pierpaolo ; Gnani, Elena ; Reggiani, Susanna ; Gnudi, Antonio ; Esseni, David ; Selmi, Luca ; Baccarani, Giorgio
Author_Institution :
Dept. of Electron., Univ. of Bologna, Bologna
Abstract :
We investigate the transport properties of silicon- nanowire FETs by using two different approaches to the solution of the Boltzmann equation for the quasi-1-D electron gas, namely, the Monte Carlo method and a deterministic numerical solver. In both cases, we first solve the coupled Schrodinger-Poisson equations to extract the profiles of the 1-D subbands along the channel; next, the coupled multisubband Boltzmann equations are tackled with the two different procedures. A very good agreement is achieved between the two approaches to the transport problem in terms of mobility, drain-current, and internal physical quantities, such as carrier-distribution functions and average velocities. Some peculiar features of the low-field mobility as a function of the wire diameter and gate bias are discussed and justified based on the subband energy and wave-function behavior within the cylindrical geometry of the nanowire, as well as the heavy degeneracy of the electron gas at large gate biases.
Keywords :
Boltzmann equation; Monte Carlo methods; Poisson equation; Schrodinger equation; electron gas; elemental semiconductors; nanowires; silicon; transport processes; 1D subbands; Boltzmann transport equation; Monte Carlo approaches; Schrodinger-Poisson equations; carrier-distribution functions; coupled multisubband Boltzmann equations; cylindrical geometry; deterministic numerical solver; gate bias; quasi-1D electron gas; silicon nanowires; silicon-nanowire FET; subband energy; transport property; wave-function behavior; Boltzmann equation; Electrons; FETs; MOSFETs; Monte Carlo methods; Nanowires; Scattering; Silicon; Strontium; Wire; Boltzmann transport equation; Monte Carlo; mobility; nanowires; simulation; surface roughness;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2008.926230