• DocumentCode
    816526
  • Title

    CCD Charge Injection Structure at Very Small Signal Levels

  • Author

    Prigozhin, Gregory ; Burke, Barry ; Bautz, Marshall ; Kissel, Steve ; LaMarr, Beverly

  • Author_Institution
    Kavli Inst. for Astrophys. & Space Res., Massachusetts Inst. of Technol., Cambridge, MA
  • Volume
    55
  • Issue
    8
  • fYear
    2008
  • Firstpage
    2111
  • Lastpage
    2120
  • Abstract
    A frame transfer charge-coupled device (CCD) designed for X-ray detection on board the SUZAKU spacecraft includes an input serial register and a charge injection structure which allows a very uniform injection of extremely small charge packets into the imaging section of the device. A variation of the fill-and-spill method was implemented to inject charge into the CCD. Very small charge packets (down to just a few electrons) can be reproducibly injected with noise as low as five-electron rms. The operation of the structure is described, and the results of the measurements are compared with the simulations. We have measured electron ldquoevaporationrdquo over potential barrier as a function of time, results being in excellent agreement with our model. By fitting a model to the data, it is possible to determine the internal capacitance of the input node. Charge injection noise as a function of signal charge was measured, and the results are also in agreement with theory. The designed structure can be used as a tool for studying and mitigating radiation damage effects in CCDs.
  • Keywords
    CCD image sensors; X-ray detection; aerospace instrumentation; capacitance; charge injection; circuit noise; proton effects; radiation hardening (electronics); space vehicle electronics; CCD charge injection structure; SUZAKU spacecraft; X-ray detection; active pixel sensor; charge injection noise; charge-coupled device design; electron evaporation; fill-and-spill method; internal capacitance determination; kTC noise; proton irradiation; radiation damage effects; very small signal levels; Acoustical engineering; Capacitance; Charge coupled devices; Charge measurement; Current measurement; Electrons; Optical imaging; Space vehicles; Time measurement; X-ray detection; $kTC$ noise; Active pixel sensor (APS); X-ray; charge injection; charge-coupled device (CCD);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2008.926732
  • Filename
    4578881