Title :
Performance of Ge-on-Si p-i-n Photodetectors for Standard Receiver Modules
Author :
Morse, Mike ; Dosunmu, Olufemi ; Sarid, Gadi ; Chetrit, Yoel
Author_Institution :
Intel Corp., Santa Clara, CA
Abstract :
Ge on Si p-i-n photodetectors with areas which are compatible with commercially available receivers have been fabricated and tested. A dark current density of 6 mA/cm2 at -1-V bias has been measured at room temperature; when heated to 85 degC, the measured dark current increases by a factor of nine. A responsivity of 0.59 A/W at 850 nm has been measured from these Ge detectors, which matches or exceeds commercially available GaAs devices. We have measured bandwidths approaching 9 GHz at -2-V bias from 50-mum diameter Ge detectors, and have observed eye diagrams comparable to those obtained from GaAs-based receivers at 4.25 Gb/s
Keywords :
dark conductivity; elemental semiconductors; germanium; heat treatment; optical fibre communication; optical receivers; p-i-n photodiodes; photodetectors; silicon; 293 to 298 K; 4.25 Gbit/s; 50 mum; 85 degC; 850 nm; 9 GHz; GaAs devices; GaAs-based receivers; Ge detectors; Ge-Si; Ge-on-Si photodetectors; Si; dark current density; eye diagrams; heating; p-i-n photodetectors; responsivity; room temperature; standard receiver modules; Bandwidth; Current measurement; Dark current; Density measurement; Detectors; Gallium arsenide; PIN photodiodes; Photodetectors; Temperature measurement; Testing; Germanium; photodectectors; receivers;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2006.885623