Title :
Single-layer antireflection coating of semiconductor lasers: polarization properties and the influence of the laser structure
Author :
Atternäs, Lennart ; Thylén, Lars
Author_Institution :
Ericsson Telecom, Stockholm, Sweden
Abstract :
Theoretical calculations of the modal reflectance of semiconductor laser facets, giving conditions for the coating index and thickness for a prescribed modal reflectance for TE and TM polarized light, are presented. A simplified method of calculating the modal reflectance is suggested and compared to a more exact method as well as to two other published methods. The possibilities of simultaneously achieving low reflectance for both polarizations are investigated with reference to the laser structure.<>
Keywords :
antireflection coatings; light polarisation; reflectivity; semiconductor junction lasers; TE polarised light; TM polarized light; coating index; modal reflectance; semiconductor laser facets; single-layer antireflection coating; thickness; Coatings; Laser modes; Laser theory; Optical fiber polarization; Optical polarization; Optical reflection; Optical refraction; Optical waveguides; Reflectivity; Semiconductor lasers;
Journal_Title :
Lightwave Technology, Journal of
