• DocumentCode
    816905
  • Title

    A Lumped Parameter Model for Product Flow Times in Manufacturing Lines

  • Author

    de Ron, A.J. ; Rooda, J.E.

  • Author_Institution
    Dept. of Mech. Eng., Eindhoven Univ. of Technol.
  • Volume
    19
  • Issue
    4
  • fYear
    2006
  • Firstpage
    502
  • Lastpage
    509
  • Abstract
    Based upon basic drivers for the flow time, a lumped parameter model for a manufacturing line has been derived by using Kingman´s approximation. The lumped parameter model for the flow time consists of a workstation and delay time. The workstation is characterized by the effective process time of the bottleneck workstation and the weighted sum of the coefficients of variation of all workstations. The delay time is determined by the sum of all effective process times of the nonbottleneck workstations. The advantage of the application of the lumped parameter model is that the variability of the total line is determined by a measurement at the operating point of the actual manufacturing line. This variability depends upon the operating point. Examples show that this dependency is not too strong for lines with a distinct bottleneck workstation in the actual line. From the derivation of the lumped parameter model it can be concluded that an improvement of the effective process time of the bottleneck workstation of the line results in an increase of the total variability of the line. This variability can be reduced by either reducing the variability of all workstations or the effective process times of the nonbottleneck workstations
  • Keywords
    manufacturing processes; manufacturing systems; production management; semiconductor device manufacture; Kingman approximation; delay time; flow time; lumped parameter model; manufacturing lines; manufacturing systems; product flow; variability reduction; Delay effects; Electronics industry; Manufacturing systems; Modeling; Predictive models; Semiconductor device manufacture; Throughput; Time factors; Virtual manufacturing; Workstations; Lumped parameter model; manufacturing systems; performance; variability;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2006.884728
  • Filename
    4012089