• DocumentCode
    816929
  • Title

    Kink and power saturation of 660-nm AlGaInP laser diodes

  • Author

    Yoshida, Yasuaki ; Sasaki, Motoko ; Shibata, Kimitaka ; Kawazu, Zennpei ; Ono, Ken-ichi ; Nishiguchi, Harumi ; Yagi, Tetsuya ; Nishimura, Takashi

  • Author_Institution
    Mitsubishi Electr. Corp., Hyogo, Japan
  • Volume
    41
  • Issue
    6
  • fYear
    2005
  • fDate
    6/1/2005 12:00:00 AM
  • Firstpage
    828
  • Lastpage
    832
  • Abstract
    We analyze kink and power saturation phenomena of high power 660-nm laser diodes for DVD-R/RW experimentally. Power-current (P-I) and voltage-current (V-I) characteristics of laser diodes with different cavity lengths were measured. Using these results and thermal resistances, temperature rises caused by self-heating (ΔT) and the dependence of slope efficiencies on the temperature rise (Se-ΔT) were calculated. The slope efficiencies decreased linearly with ΔT and their gradients showed the same value regardless of the cavity length, while they had no systematic dependence on the current. The kinks occurred at the same ΔT of 30°C regardless of the cavity length, while they occurred at different currents. These results indicate that the temperature rise caused by the self-heating is a key parameter for the kink and the saturation power. A method is proposed to calculate the kink and the saturation power using the gradient (Se-ΔT) and the kink temperature.
  • Keywords
    III-V semiconductors; aluminium compounds; digital versatile discs; gallium compounds; indium compounds; laser cavity resonators; quantum well lasers; thermal resistance; 660 nm; AlGaInP; AlGaInP laser diodes; DVD-R/RW; cavity lengths; kink; power saturation; power-current characteristic; self-heating; slope efficiencies; thermal resistance; voltage-current characteristic; Diode lasers; Laser theory; Optical recording; Optical saturation; Optical waveguides; Power generation; Power lasers; Temperature dependence; Thermal resistance; Waveguide lasers; Heating; modeling; optoelectronic devices; quantum-well lasers; semiconductor lasers; temperature;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2005.846697
  • Filename
    1432972