DocumentCode
817317
Title
Design for Diagnosability Guidelines
Author
Ungar, Louis Y.
Author_Institution
UCLA, Los Angeles, CA
Volume
11
Issue
4
fYear
2008
fDate
8/1/2008 12:00:00 AM
Firstpage
24
Lastpage
32
Abstract
In this paper, we will define some of the terminology, provide a model for the diagnostic process, and highlight areas of diagnostic complications. We will apply the diagnostic complications in a Venn diagram to get a better illustration and possibly create a basis for diagnosability metrics in future work. With the tools at hand, we will finally tackle the design issues by hypothesizing on various causes of each diagnostic complication and providing some (though not exhaustive) DFD guidelines.
Keywords
circuit testing; design for testability; network synthesis; DFT; Venn diagram; design for diagnosability; design for testability; diagnostic complications; guidelines; repair process; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Design for testability; Guidelines; Integrated circuit testing; Software testing; System testing;
fLanguage
English
Journal_Title
Instrumentation & Measurement Magazine, IEEE
Publisher
ieee
ISSN
1094-6969
Type
jour
DOI
10.1109/MIM.2008.4579268
Filename
4579268
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