Title :
The weighted index method: a new technique for analyzing planar optical waveguides
Author :
Robertson, Michael J. ; Kendall, Peter C. ; Ritchie, Simon ; McIlroy, Paul W A ; Adams, M.J.
Author_Institution :
British Telecom Res. Lab., Ipswich, UK
fDate :
12/1/1989 12:00:00 AM
Abstract :
A method of analyzing optical waveguides called the weighted-index technique is presented. It is particularly appropriate for planar geometries with abrupt refractive index profiles, such as semiconductor waveguides. The method is an extension of the simple effective-index and transverse-resonance methods and has a strong physical foundation. The weighted-index method is shown to give more accurate results and be valid for a wider range of structures. Although it is more complicated than the effective-index method, it can be implemented on the smallest of personal computers
Keywords :
optical waveguide theory; refractive index; abrupt refractive index profiles; personal computers; planar geometries; planar optical waveguides; semiconductor waveguides; weighted-index technique; Geometrical optics; Microcomputers; Optical planar waveguides; Optical refraction; Optical variables control; Optical waveguide components; Optical waveguides; Planar waveguides; Refractive index; Semiconductor waveguides;
Journal_Title :
Lightwave Technology, Journal of
