• DocumentCode
    817548
  • Title

    PACT: an experiment in integrating concurrent engineering systems

  • Author

    Cutkosky, Mark R. ; Engelmore, Robert S. ; Fikes, Richard E. ; Genesereth, Michael R. ; Gruber, Thomas R. ; Mark, William S. ; Tenenbaum, Jay M. ; Weber, Jay C.

  • Author_Institution
    Stanford Univ., CA, USA
  • Volume
    26
  • Issue
    1
  • fYear
    1993
  • Firstpage
    28
  • Lastpage
    37
  • Abstract
    The Palo Alto Collaborative Testbed (PACT), a concurrent engineering infrastructure that encompasses multiple sites, subsystems, and disciplines, is discussed. The PACT systems include NVisage, a distributed knowledge-based integration environment for design tools; DME (Device Modeling Environment), a model formulation and simulation environment; Next-Cut, a mechanical design and process planning system; and Designworld, a digital electronics design, simulation, assembly, and testing system. The motivations for PACT and the significance of the approach for concurrent engineering is discussed. Initial experiments in distributed simulation and incremental redesign are reviewed, and PACT´s agent-based architecture and lessons learned from the PACT experiments are described.<>
  • Keywords
    concurrent engineering; electronic engineering computing; knowledge based systems; process computer control; DME; Designworld; Device Modeling Environment; NVisage; Next-Cut; PACT; Palo Alto Collaborative Testbed; agent-based architecture; assembly; design tools; digital electronics design; disciplines; distributed knowledge-based integration environment; integrating concurrent engineering systems; mechanical design; model formulation; multiple sites; process planning system; simulation environment; subsystems; Buildings; Collaboration; Computational modeling; Computer architecture; Concurrent engineering; Electronic equipment testing; Investments; Large-scale systems; Robot kinematics; System testing;
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/2.179153
  • Filename
    179153