DocumentCode :
817607
Title :
Comparison of experimental charge collection waveforms with PISCES calculations
Author :
Knudson, A.R. ; Campbell, A.B.
Author_Institution :
US Naval Res. Lab., Washington, DC, USA
Volume :
38
Issue :
6
fYear :
1991
fDate :
12/1/1991 12:00:00 AM
Firstpage :
1540
Lastpage :
1545
Abstract :
Calculations of the charge collection transient, performed using PISCES v5.0n (Aerospace modified) are compared with previous experimental measurements for energetic He, B, Si, and Fe ions incident on 1, 3, and 10 ohm-cm silicon diodes. Lumped circuit elements are used to represent resistances, capacitance, and inductance attached to the charge collection region. PISCES does not satisfactorily reproduce the changes in the charge collection waveform that occur when bias voltage, ion, or resistivity is changed
Keywords :
electronic engineering computing; elemental semiconductors; ion beam effects; semiconductor device testing; semiconductor diodes; silicon; transients; 3 to 100 MeV; B; Fe ions; He; LET; PISCES calculations; Si; Si diodes; bias voltage; capacitance; charge collection transient; charge collection waveforms; inductance; ion irradiation; lumped circuit elements; resistances; Charge measurement; Circuits; Current measurement; Diodes; Electrical resistance measurement; Energy measurement; Helium; Iron; Performance evaluation; Silicon;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.124143
Filename :
124143
Link To Document :
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