DocumentCode :
817721
Title :
Transition Mechanism of InAs Quantum Dot to Quantum Ring Revealed by Photoluminescence Spectra
Author :
Dai, Jong-Horng ; Lee, Jheng-Han ; Lee, Si-Chen
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
Volume :
20
Issue :
16
fYear :
2008
Firstpage :
1372
Lastpage :
1374
Abstract :
The transition mechanism of InAs quantum dot (QD) to quantum ring (QR) was investigated. After the growth of InAs QDs, a thin layer of GaAs was overgrown on the InAs QD and the sample was annealed at the same temperature for a period of time. It was found that the central part of the InAs islands started to out diffuse and formed ring shape only after a deposition of a critical thickness (1 ~ 2 nm) of GaAs capped layer depending on the size of InAs QDs. This phenomenon was revealed by photoluminescence measurement and atomic force microscopy image. It is suggested that the strain energy provided by the GaAs overgrown layer is responsible for the InAs to diffuse out of the island to form QR.
Keywords :
III-V semiconductors; annealing; indium compounds; photoluminescence; semiconductor quantum dots; InAs; InAs quantum dot; atomic force microscopy; critical thickness; photoluminescence spectra; quantum ring; strain energy; Annealing; Atomic force microscopy; Atomic layer deposition; Atomic measurements; Force measurement; Gallium arsenide; Photoluminescence; Quantum dots; Shape; Temperature; Blue-shifted; outward diffusion; quantum dot (QD); quantum ring (QR);
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2008.926813
Filename :
4579310
Link To Document :
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