Title :
Waveguide Loss Measurement Using the Reflection Spectrum
Author :
Guo, W.H. ; Byrne, D. ; Lu, Q.Y. ; Donegan, J.F.
Author_Institution :
Sch. of Phys. & Centre for Telecommun. Value-Chain Driven Res. (CTVR), Semicond. Photonics Group, Dublin
Abstract :
A method for waveguide loss measurement purely based on the reflection spectrum is proposed. Using the Fourier series expansion of the single longitudinal mode in the reflection spectrum, the ratio between the second and first harmonics gives the round-trip loss even when the reflection coefficient of the launching optical field directly reflected by the waveguide facet is unknown. The internal loss of a Fabry-Perot laser diode was measured by the proposed method with results which compare well with those estimated from the amplified spontaneous emission spectrum.
Keywords :
Fourier series; infrared spectra; optical fibre couplers; optical loss measurement; optical waveguides; reflectivity; semiconductor device testing; semiconductor lasers; superradiance; Fabry-Perot laser diode internal loss measurement; Fourier series expansion; amplified spontaneous emission spectrum; fiber coupler; reflection spectrum; round-trip loss; single longitudinal mode; waveguide loss measurement; wavelength 1510 nm to 1590 nm; Diode lasers; Fourier series; Loss measurement; Optical coupling; Optical losses; Optical reflection; Optical waveguides; Propagation losses; Q measurement; Spontaneous emission; Amplified spontaneous emission (ASE); Fourier series expansion; reflection spectrum; waveguide loss;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2008.927885