Suppression of Residual Single-Photon Absorption Relative to Two-Photon Absorption in High Finesse Planar Microcavities

Author

Guo, Wei-Hua ; Dowd, John O. ; Flood, Edward ; Quinlan, Tom ; Lynch, Michael ; Bradley, Ann Louise ; Donegan, John Francis ; Bondarczuk, Krzysztof ; Maguire, Paul J. ; Barry, Liam P.

Author_Institution

Sch. of Phys., Trinity Coll. Dublin, Dublin

Volume

20

Issue

16

fYear

2008

Firstpage

1426

Lastpage

1428

Abstract

Suppression of residual single-photon absorption (SPA) relative to two-photon absorption (TPA) in a high finesse GaAs planar microcavity is explored. The TPA photocurrent becomes larger than the SPA photocurrent as long as the incident continuous-wave optical power exceeds 0.09 mW. An optical power of 5 mW would be required if the relative SPA suppression did not exist.

Keywords

III-V semiconductors; gallium arsenide; integrated optoelectronics; light absorption; microcavities; photoconductivity; photodetectors; photoemission; two-photon processes; GaAs; TPA photodetectors; continuous-wave optical power; high finesse planar microcavities; photocurrent; power 5 mW; residual single-photon absorption suppression; two-photon absorption; Absorption; Bonding; Floods; Frequency; Microcavities; Mirrors; Nonlinear optics; Optical sensors; Photoconductivity; Photodetectors; Finesse; planar microcavity; single-photon absorption (SPA); two-photon absorption (TPA);

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2008.927886

Filename

4579313