Title :
New methodology for combined Simulation of delta-I noise interaction with interconnect noise for wide, on-chip data-buses using lossy transmission-line power-blocks
Author :
Deutsch, Alina ; Smith, Howard H. ; Rubin, Barry J. ; Krauter, Byron L. ; Kopcsay, Gerard V.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
A new technique is described for reducing computational complexity and improving accuracy of combined power distribution and interconnect noise prediction for wide, on-chip data-buses. The methodology uses lossy transmission-line power-blocks with frequency-dependent properties needed for the multigigahertz clock frequencies. The interaction between delta-I noise, common-mode noise, and crosstalk and their effect on timing is illustrated with simulations using representative driver and receiver circuits and on-chip interconnections.
Keywords :
circuit simulation; integrated circuit interconnections; integrated circuit noise; microprocessor chips; common-mode noise; computational complexity; crosstalk; data buses; delta-I noise; driver circuits; interconnect noise prediction; lossy transmission line power blocks; on-chip interconnections; on-chip power distribution noise; on-chip simultaneously switching noise; receiver circuits; Circuit noise; Computational complexity; Computational modeling; Crosstalk; Frequency; Integrated circuit interconnections; Noise reduction; Power distribution; Propagation losses; Transmission lines; Delta-I noise; on-chip interconnect noise; on-chip power distribution noise; on-chip simultaneously switching noise;
Journal_Title :
Advanced Packaging, IEEE Transactions on
DOI :
10.1109/TADVP.2005.862647