DocumentCode
817968
Title
Techniques for minimizing space proton damage in scientific charge coupled devices
Author
Holland, Andrew ; Holmes-Siedle, Andrew ; Johlander, Bengt ; Adams, Leonard
Author_Institution
Leicester Univ., UK
Volume
38
Issue
6
fYear
1991
fDate
12/1/1991 12:00:00 AM
Firstpage
1663
Lastpage
1670
Abstract
The authors describe proton irradiation tests and theoretical prediction programmes, mounted as part of the European Space Agency´s TRP project, to show the way in which damage in EEV scientific CCDs increases with time in space. The tests give hope that certain modifications of the chip, present in some of the samples tested, can alleviate the damage considerably. Radiation damage levels required with the passage of time in the XMM X-ray astronomy mission can now be stated. With fair confidence, one can now outline engineering measures to harden the system to minimize the space damage
Keywords
charge-coupled device circuits; proton effects; radiation hardening (electronics); EEV scientific CCDs; ESA; TRP project; XMM X-ray astronomy mission; charge coupled devices; engineering measures; proton irradiation tests; space proton damage; Astronomy; Charge coupled devices; Energy resolution; Focusing; Protons; Space charge; Space technology; Spectroscopy; Telescopes; X-ray imaging;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.124160
Filename
124160
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