• DocumentCode
    817968
  • Title

    Techniques for minimizing space proton damage in scientific charge coupled devices

  • Author

    Holland, Andrew ; Holmes-Siedle, Andrew ; Johlander, Bengt ; Adams, Leonard

  • Author_Institution
    Leicester Univ., UK
  • Volume
    38
  • Issue
    6
  • fYear
    1991
  • fDate
    12/1/1991 12:00:00 AM
  • Firstpage
    1663
  • Lastpage
    1670
  • Abstract
    The authors describe proton irradiation tests and theoretical prediction programmes, mounted as part of the European Space Agency´s TRP project, to show the way in which damage in EEV scientific CCDs increases with time in space. The tests give hope that certain modifications of the chip, present in some of the samples tested, can alleviate the damage considerably. Radiation damage levels required with the passage of time in the XMM X-ray astronomy mission can now be stated. With fair confidence, one can now outline engineering measures to harden the system to minimize the space damage
  • Keywords
    charge-coupled device circuits; proton effects; radiation hardening (electronics); EEV scientific CCDs; ESA; TRP project; XMM X-ray astronomy mission; charge coupled devices; engineering measures; proton irradiation tests; space proton damage; Astronomy; Charge coupled devices; Energy resolution; Focusing; Protons; Space charge; Space technology; Spectroscopy; Telescopes; X-ray imaging;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.124160
  • Filename
    124160