DocumentCode :
818030
Title :
Application of phase detection frequency domain reflectometry for locating faults in an F-18 flight control harness
Author :
Chung, You Chung ; Furse, Cynthia ; Pruitt, Jeremy
Author_Institution :
Inf. & Commun. Eng. Dept., Dae Gu Univ., Kyungbuk, South Korea
Volume :
47
Issue :
2
fYear :
2005
fDate :
5/1/2005 12:00:00 AM
Firstpage :
327
Lastpage :
334
Abstract :
The performance of a phase-detection frequency-domain reflectometer (PD-FDR) for locating open and short circuits (hard faults) in a Navy F-18 flight control harness has been tested, and the analytical expressions for accuracy verified. Nine different types of aircraft wires appear in this harness: twisted pair, shielded wires with 1-4 inner conductors, "filter wire," and bundles of individual wires. PD-FDRs in a variety of frequency ranges (12-25, 100-220, 150-300, and 180-400 MHz) are compared. Signal processing techniques are utilized to remove the reflections where the PD-FDR is connected to the wire harness, which is critical to obtaining accurate measurements, particularly for short lengths of wire. For this specific application, open and short circuits are located to within 2.5 cm (1 in) for PD-FDR200 and 11 cm (5.5 in) for PD-FDR25 for wires ranging from 9 cm to 9.15 m (6-360 in).
Keywords :
aircraft control; aircraft maintenance; fault location; reflectometry; signal processing; wires (electric); 100 to 400 MHz; 12 to 25 MHz; 9 to 9.15 cm; Navy F-18 flight control harness; aircraft wires; faults location; filter wire; inner conductors; open circuit location; phase detection frequency domain reflectometry; shielded wires; short circuit location; signal processing technique; twisted pair; Aerospace control; Circuit faults; Circuit testing; Conductors; Frequency domain analysis; Military aircraft; Performance analysis; Phase detection; Reflectometry; Wires; Aging wire; frequency domain reflectometer (FDR); reflectometry; wire fault location;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2005.847403
Filename :
1433057
Link To Document :
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