DocumentCode
81812
Title
Application of Particle Filter Technique for Lifetime Determination of a LED Driver
Author
Song Lan ; Cher Ming Tan
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Volume
15
Issue
2
fYear
2015
fDate
Jun-15
Firstpage
163
Lastpage
173
Abstract
Assessing product reliability through its degradation study is gaining wider acceptance as it provides insight to its degradation physics and shorten the required test time. In this paper, a degradation study for a linear-mode LED driver is conducted, and it is found that the measurement errors incorporated in the degradation study can reduce the accuracy of its lifetime estimation and that the errors cannot be reduced by using conventional regression method such as nonlinear least squares (NLS) and nonlinear mixed-effect estimation (NLME). To improve the estimation accuracy, a particle filter (PF) is implemented and combined with NLS for a single test unit, and a PF is combined with NLME for grouped test units. With this combination, the minimum test time is only one-fifth of the conventional method and the coefficient of variation for t50% is reduced by 71% as compared with using NLME alone. With the proposed methods, we can also determine the remaining useful life of a product in situ as illustrated in this paper.
Keywords
driver circuits; least squares approximations; light emitting diodes; particle filtering (numerical methods); regression analysis; reliability; NLME; NLS; conventional regression method; degradation physics; degradation study; estimation accuracy; grouped test unit; lifetime determination; lifetime estimation accuracy reduction; linear-mode LED driver; measurement errors; minimum test time; nonlinear least squares; nonlinear mixed-effect estimation; particle filter technique; product reliability; remaining useful life; single-test unit; test time; Atmospheric measurements; Degradation; Estimation; Light emitting diodes; Particle filters; Particle measurements; Reliability; Bootstrap method; bootstrap method; confidence interval; linear mode LED driver; linear-mode LED driver; minimum test time; mixed effect estimation; non-linear; nonlinear mixed-effect estimation (NLME); particle filter; particle filter (PF); remaining useful life;
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2015.2407410
Filename
7050358
Link To Document