Title :
Statistical Errors in Biasing Monte Carlo Simulations With Applications to Polarization-Mode Dispersion Compensators
Author :
Menyuk, Curtis R.
Author_Institution :
Dept. of Comput. Sci. & Electr. Eng., Univ. of Maryland Baltimore County, MD
Abstract :
The possible sources of error in Monte Carlo (MC) simulations are errors in physical modeling, coding errors (bugs), statistical errors, and algorithmic errors. While most algorithmic errors lead to large statistical errors, subtle algorithmic errors that do not lead to statistical errors are at least theoretically possible. These sources of error are reviewed, with the emphasis on statistical errors. Methods for calculating the statistical error in two types of biasing MC simulation, i.e., 1) standard importance sampling and 2) multicanonical, are described. The former requires a priori knowledge of how to bias the simulation, while the latter does not. Examples are drawn from the work of the author and his colleagues on calculating the effects of polarization-mode dispersion in optical fiber communication systems. Potential pitfalls when MC simulation codes are not carefully validated and statistical errors are not carefully monitored are described. A proposal for "best practice" in which statistical errors are always presented in conjunction with MC simulations is made
Keywords :
compensation; error statistics; importance sampling; optical fibre communication; optical fibre dispersion; optical fibre polarisation; Monte Carlo simulation; algorithmic errors; multicanonical; polarization-mode dispersion compensator; standard importance sampling; statistical errors; Computational modeling; Computer bugs; Computer errors; Computer simulation; Discrete event simulation; Monitoring; Monte Carlo methods; Optical fiber communication; Polarization mode dispersion; Proposals; Coding errors; Monte Carlo (MC) simulations; PMD compensators; importance sampling; multicanonical simulations; polarization-mode dispersion (PMD); statistical errors;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2006.883131