DocumentCode :
818228
Title :
Silicon lattice constant: limits in IMGC X-ray/optical interferometry
Author :
Basile, Giuseppe ; Bergamin, Angelo ; Cavagnero, Giovanni ; Mana, Giovanni ; Vittone, Ettore ; Zosi, Gianfranco
Author_Institution :
Instituto di Metrologia
Volume :
40
Issue :
2
fYear :
1991
fDate :
4/1/1991 12:00:00 AM
Firstpage :
98
Lastpage :
102
Keywords :
Force measurement; Lattices; Optical interferometry; Optical refraction; Optical variables control; Refractive index; Shape measurement; Silicon; X-ray diffraction; X-ray lasers;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1990.1032891
Filename :
1032891
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=818228
