DocumentCode :
818235
Title :
A quantitative technique to analyze materials trade-off for SEM `E´
Author :
Ng, Lee H. ; Field, Frank R.
Author_Institution :
IBIS Asociates Inc., Wellesley, MA, USA
Volume :
15
Issue :
1
fYear :
1992
fDate :
2/1/1992 12:00:00 AM
Firstpage :
78
Lastpage :
86
Abstract :
The standard electronic module (SEM) is defined by a Department of Defense specification designed to optimize electronic module materials and designs for the military, as well as to reduce system life cycle cost through standardization of design and test requirements. The size of the module is defined by its format designation. For example, the E format specifies a substrate dimension of 133 mm (5.25 in) by 152.4 mm (6 in). However, the specification does not define the materials composing the substrate, leaving material specification to the module designer. The performance requirements for SEM E are evaluated using a technique called multiattribute utility analysis (MAUA). This technique has been employed in a wide range of engineering problems in general, and materials specification problems in particular, and its application to this problem yields rich insights into the critical elements of materials selection for the SEM E application
Keywords :
design engineering; hybrid integrated circuits; military equipment; packaging; 133 mm; 152.4 mm; Department of Defense specification; E format; MAUA; SEM E; electronic module materials; format designation; materials selection; materials specification; materials trade-off; module size; multiattribute utility analysis; multichip modules; performance requirements; quantitative technique; standard electronic module; standardization of design; substrate dimension; system life cycle cost; test requirement standardization; Cost function; Design engineering; Design optimization; Electronic equipment testing; Life testing; Military standards; Performance analysis; Printed circuits; Reliability engineering; Standardization;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.124195
Filename :
124195
Link To Document :
بازگشت