• DocumentCode
    81824
  • Title

    Spectral Conditions for Negative Imaginary Systems With Applications to Nanopositioning

  • Author

    Mabrok, M.A. ; Kallapur, Abhijit G. ; Petersen, Ian R. ; Lanzon, A.

  • Author_Institution
    Sch. of Eng. & Inf. Technol., Univ. of New South Wales, Canberra, ACT, Australia
  • Volume
    19
  • Issue
    3
  • fYear
    2014
  • fDate
    Jun-14
  • Firstpage
    895
  • Lastpage
    903
  • Abstract
    The negative imaginary (NI) property is exhibited by many systems such as flexible structures with force actuators and position sensors and can be used to prove the robust stability of flexible structure control systems. In this paper, we derive methods to check for the NI and strict negative imaginary (SNI) properties in both the single-input single-output as well as multi-input multi-output cases. The proposed methods are based on spectral conditions on a corresponding Hamiltonian matrix obtained for a given system transfer function matrix. Under certain conditions, a given transfer function matrix satisfies the NI property if and only if the corresponding Hamiltonian matrix has no pure imaginary eigenvalues with odd multiplicity. It is also shown that a given transfer function matrix satisfies the SNI property if and only if the corresponding Hamiltonian matrix has no eigenvalues on the imaginary axis, except at the origin. The results of this paper are applied to check the NI property in two nanopositioning applications.
  • Keywords
    MIMO systems; eigenvalues and eigenfunctions; nanopositioning; robust control; transfer function matrices; Hamiltonian matrix; SNI properties; eigenvalues; multiinput multioutput cases; nanopositioning; negative imaginary systems; spectral conditions; strict negative imaginary properties; transfer function matrix; Flexible structures; Hamiltonian matrix; negative imaginary systems; spectral conditions; transfer function matrix;
  • fLanguage
    English
  • Journal_Title
    Mechatronics, IEEE/ASME Transactions on
  • Publisher
    ieee
  • ISSN
    1083-4435
  • Type

    jour

  • DOI
    10.1109/TMECH.2013.2263292
  • Filename
    6522137