DocumentCode :
818310
Title :
Critical temperatures of contact materials
Author :
Ding, Bingjun ; Li, Hongqun ; Wang, Xiaotian ; Wang, Jimei
Author_Institution :
Dept. of Mater. Sci. & Eng., Xi´´an Jiaotong Univ., China
Volume :
15
Issue :
1
fYear :
1992
fDate :
2/1/1992 12:00:00 AM
Firstpage :
118
Lastpage :
120
Abstract :
The influence of cathode temperatures on the dielectric strength of contact materials is investigated in the temperature region between 300 and 1600 K. Experimental results show that contact materials investigated in this paper have certain critical temperatures. Below the critical temperatures, the dielectric strengths of the materials are equal to or greater than those at room temperature; but above the critical temperatures, the dielectric strengths decrease rapidly. The critical temperatures for CuSe and CuCr are about 1200 and 1300 K, respectively. The critical temperature for Cu is also 1200 K. The influence of temperature on dielectric strength is discussed
Keywords :
chromium alloys; circuit breakers; copper; copper alloys; electric breakdown; electric strength; electrical contacts; selenium alloys; vacuum insulation; 300 to 1600 K; Cu; CuCr; CuCr alloys; CuSe; CuSe alloys; cathode temperatures; contact materials; critical temperatures; dielectric strength; temperature region; vacuum interrupters; Anodes; Breakdown voltage; Cathodes; Dielectric breakdown; Dielectric materials; Dielectric measurements; Electric breakdown; Electrodes; Interrupters; Temperature measurement;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.124201
Filename :
124201
Link To Document :
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