Title :
Comparison of SEUTool results to experimental results in boeing radiation tolerant DSP (BDSP C30)
Author :
Duncan, Adam R. ; Srinivasan, Varadarajan ; Sternberg, Andrew L. ; Robinson, William H. ; Bhuva, Bharat L. ; Massengill, LloydW
Author_Institution :
NAVSEA Crane, IN, USA
Abstract :
A CAD tool (SEUTool) is analyzed for simulating single-event upsets (SEUs) in large combinational logic circuits. SEUTool cross-section results show excellent agreement with experimental test data taken with the Boeing BDSP C30.
Keywords :
circuit analysis computing; combinational circuits; digital signal processing chips; technology CAD (electronics); Boeing BDSP C30; Boeing radiation tolerant; CAD tool; SEUTool cross-section; combinational logic circuits; digital signal processing; single-event upsets; Circuit simulation; Circuit testing; Clocks; Computational modeling; Digital signal processing; Logic circuits; Microelectronics; SPICE; Single event transient; Single event upset; Digital signal processing (DSP); SEUTool; SPICE; modeling; single-event effects (SEEs); single-event upsets (SEUs);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2005.860693
