• DocumentCode
    818420
  • Title

    Comparison of SEUTool results to experimental results in boeing radiation tolerant DSP (BDSP C30)

  • Author

    Duncan, Adam R. ; Srinivasan, Varadarajan ; Sternberg, Andrew L. ; Robinson, William H. ; Bhuva, Bharat L. ; Massengill, LloydW

  • Author_Institution
    NAVSEA Crane, IN, USA
  • Volume
    52
  • Issue
    6
  • fYear
    2005
  • Firstpage
    2224
  • Lastpage
    2230
  • Abstract
    A CAD tool (SEUTool) is analyzed for simulating single-event upsets (SEUs) in large combinational logic circuits. SEUTool cross-section results show excellent agreement with experimental test data taken with the Boeing BDSP C30.
  • Keywords
    circuit analysis computing; combinational circuits; digital signal processing chips; technology CAD (electronics); Boeing BDSP C30; Boeing radiation tolerant; CAD tool; SEUTool cross-section; combinational logic circuits; digital signal processing; single-event upsets; Circuit simulation; Circuit testing; Clocks; Computational modeling; Digital signal processing; Logic circuits; Microelectronics; SPICE; Single event transient; Single event upset; Digital signal processing (DSP); SEUTool; SPICE; modeling; single-event effects (SEEs); single-event upsets (SEUs);
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2005.860693
  • Filename
    1589187
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=818420