Title :
Measurements of optical wavelength ratios using a compensated field sigmameter
Author :
Himbert, Marc ; Bouchareine, Patrick ; Hachour, Ahmed ; Juncar, Patrick ; Millerioux, Yves ; Razet, Annick
Author_Institution :
Institute Nationale de Metrologie
fDate :
4/1/1991 12:00:00 AM
Keywords :
Atom optics; Atomic measurements; Frequency; Interference; Optical interferometry; Optical mixing; Optical refraction; Oscillators; Phase measurement; Wavelength measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1990.1032915