DocumentCode
81856
Title
A Method to Determine LRRM Calibration Standards in Measurement Configurations Affected by Leakage
Author
Dahlberg, Krista ; Silvonen, Kimmo
Author_Institution
Dept. of Radio Sci. & Eng., Aalto Univ., Espoo, Finland
Volume
62
Issue
9
fYear
2014
fDate
Sept. 2014
Firstpage
2132
Lastpage
2139
Abstract
This paper presents a novel method to define the calibration standards for the line-reflect-reflect-match method in a reciprocal 16-term error network. The procedure is based on four two-port calibration measurements: a thru line, a pair of matches, and two pure reactance pairs. The line standard and the resistance of the match standard need to be exactly known. The reactances of the match and lossless open and short standards are found using their raw S-parameter measurement data. The algorithm is limited to second-tier calibration of a reciprocal error network with a pre-calibrated network analyzer. Detailed theory of the method is presented and its functionality is demonstrated by practical on-wafer measurements and simulation.
Keywords
S-parameters; calibration; electric reactance measurement; electric resistance measurement; measurement standards; network analysers; LRRM calibration standard; S-parameter measurement data; line-reflect-reflect-match method; on-wafer measurement; pre-calibrated network analyzer; reciprocal 16-term error network; two-port calibration measurement; Calibration; Equations; Loss measurement; Mathematical model; Measurement uncertainty; Ports (Computers); Standards; 16-term error model; Calibration standards; network analyzer; on-wafer measurements; scattering-parameter measurements;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2014.2333494
Filename
6849503
Link To Document