DocumentCode :
81856
Title :
A Method to Determine LRRM Calibration Standards in Measurement Configurations Affected by Leakage
Author :
Dahlberg, Krista ; Silvonen, Kimmo
Author_Institution :
Dept. of Radio Sci. & Eng., Aalto Univ., Espoo, Finland
Volume :
62
Issue :
9
fYear :
2014
fDate :
Sept. 2014
Firstpage :
2132
Lastpage :
2139
Abstract :
This paper presents a novel method to define the calibration standards for the line-reflect-reflect-match method in a reciprocal 16-term error network. The procedure is based on four two-port calibration measurements: a thru line, a pair of matches, and two pure reactance pairs. The line standard and the resistance of the match standard need to be exactly known. The reactances of the match and lossless open and short standards are found using their raw S-parameter measurement data. The algorithm is limited to second-tier calibration of a reciprocal error network with a pre-calibrated network analyzer. Detailed theory of the method is presented and its functionality is demonstrated by practical on-wafer measurements and simulation.
Keywords :
S-parameters; calibration; electric reactance measurement; electric resistance measurement; measurement standards; network analysers; LRRM calibration standard; S-parameter measurement data; line-reflect-reflect-match method; on-wafer measurement; pre-calibrated network analyzer; reciprocal 16-term error network; two-port calibration measurement; Calibration; Equations; Loss measurement; Mathematical model; Measurement uncertainty; Ports (Computers); Standards; 16-term error model; Calibration standards; network analyzer; on-wafer measurements; scattering-parameter measurements;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2014.2333494
Filename :
6849503
Link To Document :
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