• DocumentCode
    81856
  • Title

    A Method to Determine LRRM Calibration Standards in Measurement Configurations Affected by Leakage

  • Author

    Dahlberg, Krista ; Silvonen, Kimmo

  • Author_Institution
    Dept. of Radio Sci. & Eng., Aalto Univ., Espoo, Finland
  • Volume
    62
  • Issue
    9
  • fYear
    2014
  • fDate
    Sept. 2014
  • Firstpage
    2132
  • Lastpage
    2139
  • Abstract
    This paper presents a novel method to define the calibration standards for the line-reflect-reflect-match method in a reciprocal 16-term error network. The procedure is based on four two-port calibration measurements: a thru line, a pair of matches, and two pure reactance pairs. The line standard and the resistance of the match standard need to be exactly known. The reactances of the match and lossless open and short standards are found using their raw S-parameter measurement data. The algorithm is limited to second-tier calibration of a reciprocal error network with a pre-calibrated network analyzer. Detailed theory of the method is presented and its functionality is demonstrated by practical on-wafer measurements and simulation.
  • Keywords
    S-parameters; calibration; electric reactance measurement; electric resistance measurement; measurement standards; network analysers; LRRM calibration standard; S-parameter measurement data; line-reflect-reflect-match method; on-wafer measurement; pre-calibrated network analyzer; reciprocal 16-term error network; two-port calibration measurement; Calibration; Equations; Loss measurement; Mathematical model; Measurement uncertainty; Ports (Computers); Standards; 16-term error model; Calibration standards; network analyzer; on-wafer measurements; scattering-parameter measurements;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2014.2333494
  • Filename
    6849503