DocumentCode :
818620
Title :
Comparison of the quantized hall resistance in different GaAs/Al
x
Ga
1-x
As heterostructures
Author :
Jeckelmann, Beat ; Schwitz, Wolfgang ; Buhlmann, Hans-Jorg ; Houldre, R. ; Hegems, M. ; Jucknischke, Dietmar ; Py, Marcel A.
Author_Institution :
Swiss Federal Office of Meteorology
Volume :
40
Issue :
2
fYear :
1991
fDate :
4/1/1991 12:00:00 AM
Firstpage :
231
Lastpage :
233
Keywords :
Electrical resistance measurement; Electrons; Gallium arsenide; Hall effect; Laboratories; Quantization; Resistors; Switches; Testing; Voltage;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1990.1032924
Filename :
1032924
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=818620
