Title :
Direct comparison of quantized hall resistances
Author :
Piquemal, Francois ; Etienne, Bernard ; Andre, Jean-pierre ; Patillon, Jean-Noel
Author_Institution :
Laboratoire Central des Industires Electriques
fDate :
4/1/1991 12:00:00 AM
Keywords :
Bridge circuits; Current measurement; Detectors; Electrical resistance measurement; FETs; Gallium arsenide; Hall effect; Microcomputers; Power measurement; Uncertainty;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1990.1032925