DocumentCode
818673
Title
Electrical Characterization of NCP- and NCF-Bonded Fine-Pitch Flip-Chip-on-Flexible Packages
Author
Chan, Y.C. ; Tan, S.C. ; Lui, Nelson S M ; Tan, C.W.
Author_Institution
Dept. of Electron. Eng., City Polytech. of Hong Kong, Kowloon
Volume
29
Issue
4
fYear
2006
Firstpage
735
Lastpage
740
Abstract
Electronic portable devices are aimed towards higher response speed with a better viewing resolution display. Nonconductive paste (NCP) and nonconductive film (NCF) are the adhesive materials used in fine-pitch display applications. This study compares two commercially available adhesives for fine-pitch chip-on-flex (COF) applications. The electrical performance of the NCP-bonded COF was better compared to the NCF. The rheological properties of these materials in the initial stages and the mechanical properties of the adhesives after bonding are claimed to be the main factors. The semisolid form of the NCF which melts and flows slowly from the interconnection joints finally reduced the effective contact area in the joint as compared to the NCP. A low-pressure bonding caused entrapment of adhesive in the joints, induced stress accumulation in the Z-direction during high thermal loading, and a high coefficient of thermal expansion mismatch in between bumps, adhesive, and electrode traces on the flexible substrate were the key factors for the degradation of electrical conductivity. A high load of 100 N and above was recommended since the effective contact area built into the interconnection was good and reliable after 400 cycles of a thermal shock test of -55degC-125degC. The NCP with a higher elastic modulus which ensures higher stiffness and stability towards elongation gave a better reliability in this environmental test. Cross sectioning and scanning electron microscopy analysis provide evidence of the effective contact area of the joint before and after the thermal cycle environmental test
Keywords
adhesive bonding; chip-on-board packaging; elastic moduli; electrical conductivity; fine-pitch technology; flip-chip devices; integrated circuit interconnections; rheology; scanning electron microscopy; thermal expansion; -55 to -125 C; elastic modulus; electrical characterization; electrical conductivity; fine-pitch chip-on-flexible packages; flexible substrate; flip-chip-on-flexible packages; high thermal loading; low-pressure bonding; mechanical properties; nonconductive film bonding; nonconductive paste bonding; rheological properties; scanning electron microscopy analysis; thermal cycle environmental test; thermal expansion coefficient mismatch; thermal shock test; Bonding; Displays; Mechanical factors; Packaging; Testing; Thermal conductivity; Thermal expansion; Thermal factors; Thermal loading; Thermal stresses; Fine-pitch application; contact resistance; nonconducting adhesive;
fLanguage
English
Journal_Title
Advanced Packaging, IEEE Transactions on
Publisher
ieee
ISSN
1521-3323
Type
jour
DOI
10.1109/TADVP.2006.884814
Filename
4012247
Link To Document