DocumentCode :
818682
Title :
Measurements of the quantized hall resistance at ETL
Author :
Kinoshita, Joji ; Nishinaka, Hidefumi ; Segawa, Koji ; Van Degrift, Craig T. ; Endo, Tadashi
Author_Institution :
Electrotechnical Laboratory
Volume :
40
Issue :
2
fYear :
1991
fDate :
4/1/1991 12:00:00 AM
Firstpage :
249
Lastpage :
252
Keywords :
Current measurement; Detectors; Electrical resistance measurement; Laboratories; Optical switches; Potentiometers; Relays; Resistors; Virtual reality; Voltage;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1990.1032930
Filename :
1032930
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=818682
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