DocumentCode :
818695
Title :
Verification of Complex Analog and RF IC Designs
Author :
Chang, Henry ; Kundert, Ken
Author_Institution :
Designer´´s Guide Consulting Inc, Los Altos, CA
Volume :
95
Issue :
3
fYear :
2007
fDate :
3/1/2007 12:00:00 AM
Firstpage :
622
Lastpage :
639
Abstract :
Meeting performance specifications in the design of analog and RF (A/RF) blocks and integrated circuits (IC) continues to require a high degree of skill, creativity, and expertise. However, today´s A/RF designers are increasingly faced with a new challenge. Functional complexity in terms modes of operation, extensive digital calibration, and architectural algorithms is now overwhelming traditional A/RF design methodologies. Functionally verifying A/RF designs is a daunting task requiring a rigorous methodology. As occurred in digital design, analog verification is becoming a separate and critical task. This paper describes the verification issues faced by the A/RF designer and presents a verification methodology to address these challenges. It presents a systematic approach to A/RF verification, the concept of an analog verification engineer, how to establish the methodology, and concludes with an example
Keywords :
analogue integrated circuits; circuit simulation; formal verification; hardware description languages; integrated circuit design; mixed analogue-digital integrated circuits; radiofrequency integrated circuits; RFIC designs; analog integrated circuits; analog verification; circuit simulation; design automation; functional complexity; hardware design languages; integrated circuit measurements; integrated circuit modeling; mixed analog-digital integrated circuits; performance specifications; simulation languages; systematic approach; verification methodology; Analog integrated circuits; Calibration; Circuit simulation; Clocks; Design methodology; Explosions; Integrated circuit modeling; Radio frequency; Radiofrequency integrated circuits; Switching circuits; Analog integrated circuits; circuit modeling; circuit simulation; design automation; design methodology; hardware design languages; integrated circuit measurements; integrated circuit modeling; mixed analog–digital integrated circuits; self-testing; simulation languages;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/JPROC.2006.889384
Filename :
4167767
Link To Document :
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