Title :
Effects of heavy ion exposure on nanocrystal nonvolatile memory
Author :
Oldham, Timothy R. ; Suhail, Mohammed ; Kuhn, Peter ; Prinz, Erwin ; Kim, Hak S. ; LaBel, Kenneth A.
Author_Institution :
QSS Inc., Seabrook, MD, USA
Abstract :
Advanced nanocrystal nonvolatile memories have been exposed to heavy ion bombardment. They appear to be promising candidates for future spacecraft electronics.
Keywords :
ion beam effects; nanostructured materials; semiconductor storage; heavy ion bombardment; heavy ion exposure; nanocrystal nonvolatile memory; radiation effects; spacecraft electronics; Aerodynamics; Aerospace electronics; Aerospace engineering; Circuit testing; Electrons; Nanocrystals; Nonvolatile memory; Radiation effects; Silicon; Space technology; Component; electronics; nanocrystals; nonvolatile memory; radiation effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2005.860723
