DocumentCode
818716
Title
Investigating the use of multimeters to measure quantized hall resistance standards
Author
Cage, Marvin E. ; Yu, Dingyi ; Jeckelmann, Beat M. ; Steiner, Richard L. ; Duncan, Robert V.
Author_Institution
National Institute of Science and Technology
Volume
40
Issue
2
fYear
1991
fDate
4/1/1991 12:00:00 AM
Firstpage
262
Lastpage
266
Keywords
Calibration; Cryogenics; Electric resistance; Electrical resistance measurement; Laboratories; Measurement standards; Metrology; NIST; Resistors; Voltage;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1990.1032933
Filename
1032933
Link To Document