DocumentCode :
818720
Title :
Wavelength shift of gallium nitride light emitting diode with p-down structure
Author :
Lan, Wen-How
Author_Institution :
Dept. of Electr. Eng., Nat. Univ. of Kaohsiung, Taiwan
Volume :
52
Issue :
6
fYear :
2005
fDate :
6/1/2005 12:00:00 AM
Firstpage :
1217
Lastpage :
1219
Abstract :
Both the p-gallium nitride (GaN) on an n-light-emitting diode (LED) structure and the n-GaN on p-LED structure were fabricated by metal-organic vapor phase epitaxy on c axis sapphire substrate. The output spectra with different applied bias voltages were studied on these structures. The small amount of the wavelength shift under a forward bias condition in the proposed p-down LED structure was observed but not in the n-down LED structure. This phenomenon was characterized by the effective electric field in the well created from the built-in electric field and the applied electric field. This proposed p-down LED shows an opportunity in the application of wavelength shift-free optoelectronic devices.
Keywords :
MOCVD; MOCVD coatings; electroluminescence; gallium compounds; light emitting diodes; semiconductor quantum wells; GaN; effective electric field; electroluminescence; light emitting diode; metal-organic vapor phase epitaxy; multiple-quantum well; optoelectronic devices; p-down structure; sapphire substrate; wavelength shift; Annealing; Buffer layers; Gallium nitride; III-V semiconductor materials; Light emitting diodes; Luminescence; Ohmic contacts; Optoelectronic devices; Quantum well devices; Substrates; Electroluminescence (EL); light-emitting diodes (LEDs); multiple-quantum well (MQW); p-down; wavelength shift;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2005.848114
Filename :
1433119
Link To Document :
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